The University of Missouri Research Reactor (MURR) is home to a FEI Scios DualBeam focused ion beam scanning electron microscope (FIB-SEM) with EDS that is dedicated to radioactive sample analysis.

The SEM is located near a dedicated hot cell that can be equipped with a Psylotech mechanical load frame, a Phase II+ Vickers Hardness Tester, a Renishaw Raman confocal microscope and other tools to manipulate samples. Adjacent to the hot cell is a shielded glove box to be used for preparation of samples for microstructure analysis.

Key Features:

• Ga+ ion beam system enables site-specific milling for sub-surface analysis or lamella preparation for TEM analyses.
• Features elemental and crystallographic analysis via Oxford Aztec EDS and EBSD systems.